Schooling, Statistics, and Poverty: Can We Measure School Improvement?
- Author(s):
- Raudenbush, Stephen W.
- Publication Year:
- 2004
- Report Number:
- PIC-ANG9
- Source:
- Document Type:
- Subject/Key Words:
- No Child Left Behind (NCLB) adequate yearly progress (AYP) school quality school improvement school-mean proficiency value added
Abstract
In the ninth annual William H. Angoff Memorial Lecture, Dr. Stephen W. Raudenbush examines two competing approaches to measuring school quality and improvement and discusses their limitations for making high-stakes decisions. While supplies last, print copies can be ordered from the Policy Information Center for $15.00.