Schooling, Statistics, and Poverty: Can We Measure School Improvement?

Author(s):
Raudenbush, Stephen W.
Publication Year:
2004
Report Number:
PIC-ANG9
Source:
Document Type:
Subject/Key Words:
No Child Left Behind (NCLB) adequate yearly progress (AYP) school quality school improvement school-mean proficiency value added

Abstract

In the ninth annual William H. Angoff Memorial Lecture, Dr. Stephen W. Raudenbush examines two competing approaches to measuring school quality and improvement and discusses their limitations for making high-stakes decisions. While supplies last, print copies can be ordered from the Policy Information Center for $15.00.

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