Schooling, Statistics, and Poverty: Can We Measure School Improvement?
Author(s):
Raudenbush, Stephen W.
Publication Year:
2004
Report Number:
PIC-ANG9
Abstract:
In the ninth annual William H. Angoff Memorial Lecture, Dr. Stephen W. Raudenbush examines two competing approaches to measuring school quality and improvement and discusses their limitations for making high-stakes decisions. While supplies last, print copies can be ordered from the Policy Information Center for $15.00.
Full Report:
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Key Word(s):
No Child Left Behind (NCLB) / adequate yearly progress (AYP) / school quality / school improvement / school-mean proficiency / value added
