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Yi-Hsuan Lee

Yi-Hsuan Lee is a principal research scientist in the Research & Development (R&D) division at ETS. She joined ETS in 2007. She received an M.A. and Ph.D. in statistics in 2005 and 2007, respectively, from Columbia University. She earned a B.S. in mathematics in 2002 from the National Taiwan University in Taipei, Taiwan. 

While at ETS, her research interests have centered on test security, analysis of timing and process data, and development of quality control techniques to monitor scale stability, test performance, and item performance. Other research interests involve survival analysis and applications of statistical methods to educational measurement. She has been the R&D liaison to support operational test security work. She has provided statistical consulting service to ETS programs and products to solve operational challenges concerning test security, quality control, timing and process data, and general statistical and psychometric methodologies. She received the ETS Presidential Award in 2011 for outstanding research contributions. She is a member of the American Statistical Association and the National Council on Measurement in Education. She has served as a reviewer for journals, conference proposals, and the ETS Technical Review process. 

Publications by this author