On the Reliability of Testlet-Based Tests

Author(s):: Sireci, Stephen G.; Thissen, David; Wainer, Howard
Publication Year:: 1991
Source:: Journal of Educational Measurement, v28 n3 p237-247, Fall 1991
Document Type:: Article
Page Count:: 11
Subject/Key Words:: Models, Testlets, Test Reliability, Data Analysis, Item Response Theory (IRT)

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