Thin Versus Thick Matching in the Mantel-Haenszel Procedure for Detecting DIF
- Author(s):
- Donoghue, John R.; Allen, Nancy L.
- Publication Year:
- 1993
- Source:
- Journal of Educational Statistics, v18 n2 p131-154, Sum 1993
- Document Type:
- Article
- Page Count:
- 24
- Subject/Key Words:
- Comparative Analysis, Education--Computer simulation., Graphs, Item Bias, Item Response Theory (IRT), Differential Item Functioning (DIF), Monte Carlo Methods, Scores, Test Bias, Test Interpretation, Test Length