Thin Versus Thick Matching in the Mantel-Haenszel Procedure for Detecting DIF DIF IRT
- Author(s):
-
Donoghue, John R.;
Allen, Nancy L.
- Publication Year:
- 1993
- Source:
-
Journal of Educational Statistics, v18 n2 p131-154, Sum 1993
- Document Type:
- Article
- Page Count:
- 24
- Subject/Key Words:
-
Comparative Analysis,
Education--Computer simulation.,
Graphs,
Item Bias,
Item Response Theory (IRT),
Differential Item Functioning (DIF),
Monte Carlo Methods,
Scores,
Test Bias,
Test Interpretation,
Test Length
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