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An Empirical Bayes Approach to Mantel-Haenszel DIF Analysis DIF

Author(s):
Zwick, Rebecca J.; Lewis, Charles; Thayer, Dorothy T.
Publication Year:
1999
Source:
Journal of Educational Measurement, v36 n1 p1-28, Spr 1999
Document Type:
Article
Page Count:
28
Subject/Key Words:
Bayesian Statistics, Item Bias, Statistical Distributions, Test Items

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