An Empirical Bayes Approach to Mantel-Haenszel DIF Analysis DIF
- Author(s):
- Zwick, Rebecca J.; Lewis, Charles; Thayer, Dorothy T.
- Publication Year:
- 1999
- Source:
- Journal of Educational Measurement, v36 n1 p1-28, Spr 1999
- Document Type:
- Article
- Page Count:
- 28
- Subject/Key Words:
- Bayesian Statistics, Item Bias, Statistical Distributions, Test Items