Univariate and Bivariate Loglinear Models for Discrete Test Score Distributions

Author(s):: Holland, Paul W.; Thayer, Dorothy T.
Publication Year:: 2000
Source:: Journal of Educational and Behavioral Statistics, v25 n2 p133-183, Sum 2000
Document Type:: Article
Page Count:: 50
Subject/Key Words:: Test Items, Goodness of Fit, Statistical Analysis, Research Methodology, Measurement Techniques, Score Distribution, Scoring

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