Univariate and Bivariate Loglinear Models for Discrete Test Score Distributions
- Author(s):
- Holland, Paul W.; Thayer, Dorothy T.
- Publication Year:
- 2000
- Source:
- Journal of Educational and Behavioral Statistics, v25 n2 p133-183, Sum 2000
- Document Type:
- Article
- Page Count:
- 50
- Subject/Key Words:
- Test Items, Goodness of Fit, Statistical Analysis, Research Methodology, Measurement Techniques, Score Distribution, Scoring