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Time for the Changing of the Guard: A Farewell to Short Forms of Intelligence Tests
Author(s):
Kaufman, James C.; Kaufman, Alan S.
Publication Year:
2001
Source:
Journal of Psychoeducational Assessment, v19 n3 p245-267, Sep 2001
Document Type:
Article
Page Count:
23
Subject/Key Words:
Intelligence Tests,
Short Form Tests,
Statistical Analysis,
Validity,
Proper Test Use
Read More
http://jpa.sagepub.com/content/19/3/245.abstract