Rasch Measurement in Developing Faculty Ratings of Students Applying to Graduate School SLR

Author(s):

Kim, Sooyeon; Kyllonen, Patrick C.

Publication Year:

2008

Source:

Journal of Applied Measurement, v9 n2 p168-181, 2008

Document Type:

Article

Page Count:

14

Subject/Key Words:

Rasch Measurement, Rating Scales, College Faculty, Admission Criteria, Mentors