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Random Parameter Structure and the Testlet Model: Extension of the Rasch Testlet Model

Author(s):
Paek, Insu; Yon, Haniza; Wilson, Mark; Kang, Taehoon
Publication Year:
2009
Source:
Journal of Applied Measurement, v10 n4 p394-407, 2009
Document Type:
Article
Page Count:
14
Subject/Key Words:
Rasch Models, Variances, Random Measures, Simulation Methods, Parameter Estimation, Testlets