Random Parameter Structure and the Testlet Model: Extension of the Rasch Testlet Model
- Author(s):
- Paek, Insu; Yon, Haniza; Wilson, Mark; Kang, Taehoon
- Publication Year:
- 2009
- Source:
- Journal of Applied Measurement, v10 n4 p394-407, 2009
- Document Type:
- Article
- Page Count:
- 14
- Subject/Key Words:
- Rasch Models, Variances, Random Measures, Simulation Methods, Parameter Estimation, Testlets