Random Parameter Structure and the Testlet Model: Extension of the Rasch Testlet Model
- Author(s):
-
Paek, Insu;
Yon, Haniza;
Wilson, Mark;
Kang, Taehoon
- Publication Year:
- 2009
- Source:
-
Journal of Applied Measurement, v10 n4 p394-407, 2009
- Document Type:
- Article
- Page Count:
- 14
- Subject/Key Words:
-
Rasch Models,
Variances,
Random Measures,
Simulation Methods,
Parameter Estimation,
Testlets