Random Parameter Structure and the Testlet Model: Extension of the Rasch Testlet Model

Author(s):

Paek, Insu; Yon, Haniza; Wilson, Mark; Kang, Taehoon

Publication Year:

2009

Source:

Journal of Applied Measurement, v10 n4 p394-407, 2009

Document Type:

Article

Page Count:

14

Subject/Key Words:

Rasch Models, Variances, Random Measures, Simulation Methods, Parameter Estimation, Testlets