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Local Equating Using the Rasch Model, the OPLM, and the 2PL IRT Model-or-What Is It Anyway if the Model Captures Everything There Is to Know About the Test Takers?

Author(s):
von Davier, Matthias; Gonzalez, Jorge B.; von Davier, Alina A.
Publication Year:
2013
Source:
Journal of Educational Measurement, v50 n3 p295-303, Fal 2013
Document Type:
Article
Page Count:
9
Subject/Key Words:
Observed-Score Equating Rasch Model Local Equating Two-Parameter Logistic Model Item Response Theory One-Parameter Logistic Model Lord, Frederic M.

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