Local Equating Using the Rasch Model, the OPLM, and the 2PL IRT Model-or-What Is It Anyway if the Model Captures Everything There Is to Know About the Test Takers? 1PL 2PL IRT

Author(s):

von Davier, Matthias; Gonzalez, Jorge B.; von Davier, Alina A.

Publication Year:

2013

Source:

Journal of Educational Measurement, v50 n3 p295-303, Fal 2013

Document Type:

Article

Page Count:

9

Subject/Key Words:

Observed-Score Equating, Rasch Model, Local Equating, Two-Parameter Logistic Model, Item Response Theory, One-Parameter Logistic Model, Lord, Frederic M.

Read More

• http://onlinelibrary.wiley.com/doi/10.1111/jedm.12016/abstract