Automatic Plagiarism Detection for Spoken Responses in an Assessment of English Language Proficiency TOEFL iBT

Author(s):

Wang, Xinhao; Evanini, Keelan; Bruno, James E.; Mulholland, Matthew

Publication Year:

2016

Source:

2016 IEEE Spoken Language Technology Workshop (SLT), San Diego, CA, Dec 13-16, 2016, p121-128

Document Type:

Article

Page Count:

8

Subject/Key Words:

Plagiarism, Automatic Error Detection, Spontaneous Spoken Language, Non-Native Speakers, Automated Assessment Technology, TOEFL iBT, SpeechRater, English Language Assessment (ELA), English Language Proficiency

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• https://doi.org/10.1109/SLT.2016.7846254