Developments in Psychometric Population Models for Technology-Based Large-Scale Assessments: An Overview of Challenges and Opportunities ILSA CBA IRT PISA
Author(s):
von Davier, Matthias;
Khorramdel, Lale;
He, Qiwei;
Shin, Hyo Jeong;
Chen, Haiwen (Henry)
Publication Year:
2019
Source:
Journal of Educational and Behavioral Statistics, v44 n6 p671-705, 2019
Document Type:
Article
Page Count:
35
Subject/Key Words:
Latent Regression,
Process Data,
International Large-Scale Assessments (ILSA),
Computer Based Assessment (CBA),
Test Design,
Item Response Theory (IRT),
Item Response Time,
Population Models,
Test Validity,
Programme for International Student Assessment (PISA)
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