Developments in Psychometric Population Models for Technology-Based Large-Scale Assessments: An Overview of Challenges and Opportunities
- Author(s):
-
von Davier, Matthias;
Khorramdel, Lale;
He, Qiwei;
Shin, Hyo Jeong;
Chen, Haiwen (Henry)
- Publication Year:
- 2019
- Source:
-
Journal of Educational and Behavioral Statistics, v44 n6 p671-705, 2019
- Document Type:
- Article
- Page Count:
- 35
- Subject/Key Words:
-
Latent Regression,
Process Data,
International Large-Scale Assessments (ILSA),
Computer Based Assessment (CBA),
Test Design,
Item Response Theory (IRT),
Item Response Time,
Population Models,
Test Validity,
Programme for International Student Assessment (PISA)
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