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Developments in Psychometric Population Models for Technology-Based Large-Scale Assessments: An Overview of Challenges and Opportunities ILSA CBA IRT PISA

Author(s):
von Davier, Matthias; Khorramdel, Lale; He, Qiwei; Shin, Hyo Jeong; Chen, Haiwen (Henry)
Publication Year:
2019
Source:
Journal of Educational and Behavioral Statistics, v44 n6 p671-705, 2019
Document Type:
Article
Page Count:
35
Subject/Key Words:
Latent Regression, Process Data, International Large-Scale Assessments (ILSA), Computer Based Assessment (CBA), Test Design, Item Response Theory (IRT), Item Response Time, Population Models, Test Validity, Programme for International Student Assessment (PISA)

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