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Evaluating Item Fit Statistic Thresholds in PISA: Analysis of Cross‐Country Comparability of Cognitive Items PISA IRT LSA

Author(s):
Joo, Seang-Hwane; Khorramdel, Lale; Yamamoto, Kentaro; Shin, Hyo Jeong; Robin, Frederic
Publication Year:
2021
Source:
Educational Measurement: Issues and Practice, v40 n2 p37-48, Summer 2021
Document Type:
Article
Page Count:
12
Subject/Key Words:
Programme for International Student Assessment (PISA), Large-Scale Assessments (LSA), Item Response Theory (IRT), Item Parameter Estimation, Latent Trait, Calibration, Score Comparability, Test Comparability, Invariance, Misfit, Item Fit Statistics

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