skip to main content skip to footer

Psychometric Approaches to Analyzing C-Tests 2PL IRT L2 EL

Author(s):
Alpizar, David; Li, Tongyun; Norris, John M.; Gu, Lixiong
Publication Year:
2023
Source:
Language Testing, v40 n1 p107-132, Jan 2023
Document Type:
Article
Page Count:
26
Subject/Key Words:
2-Parameter Logistic (2PL) Model, Multidimensional IRT Model, Item Response Theory (IRT), Local Item Dependence, Testlet, Second Language (L2), English Learners (EL), English Language Proficiency, Psychometrics

Read More