The Standardized S-X2 Statistic for Assessing Item Fit IRT
- Author(s):
- Han, Zhuangzhuang; Sinharay, Sandip; Johnson, Matthew S.; Liu, Xiang
- Publication Year:
- 2023
- Source:
- Applied Psychological Measurement, v47 n1 p3-18, Jan 2023
- Document Type:
- Article
- Page Count:
- 16
- Subject/Key Words:
- Item Fit, S-X2, Simulation Study, Item Response Theory (IRT), Data Analysis, Model Fit