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The Role of International Large-Scale Assessments: Perspectives from Technology, Economy, and Educational Research

Author(s):
von Davier, Matthias; Gonzalez, Eugenio J.; Kirsch, Irwin S.; Yamamoto, Kentaro
Publication Year:
2013
Source:
Book; Dordrecht: Springer
Document Type:
Book
Page Count:
160
Subject/Key Words:
Educational tests and measurements, Methodology, Large-Scale Assessment, Educational Technology, Educational Research

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