Some How and Which for Practical Tailored Testing

Author(s):

Lord, Frederic M.

Publication Year:

1980

Source:

van der Kamp, Leo J. Th.; Langerak, Willem F.; de Gruijter, Dato N. M. (eds.) Psychometrics for Educational Debates. Chichester: John Wiley & Sons, 1980, p189-205

Document Type:

Chapter

Page Count:

17

Subject/Key Words:

Test Construction, LOGIST, Adaptive Testing, Computer Assisted Testing