A New Look at Bias in Aptitude Tests

Author(s):

Scheuneman, Janice Dowd

Publication Year:

1981

Source:

Merrifield (ed.) New Directions in Testing and Measurement, Number 12: Measuring Human Abilities. San Francisco: Jossey-Bass Inc., 1981, p3-35

Document Type:

Chapter

Page Count:

33

Subject/Key Words:

Academic Aptitude, Aptitude Tests, Elementary Secondary Education, Ethnic Bias, Intelligence Tests, Statistical Bias, Test Bias, Test Items, Test Validity, Testing Problems