Robustness of Item Response Models and Effects of Test Length and Sample Size on the Precision of Ability Estimates
- Author(s):
- Hambleton, Ronald K.; Cook, Linda L.
- Publication Year:
- 1983
- Source:
- Weiss, David J. (ed.) New Horizons in Testing: Latent Trait Test Theory and Computerized Adaptive Testing. New York: Academic Press, Inc., 1983, p31-49
- Document Type:
- Chapter
- Page Count:
- 19
- Subject/Key Words:
- Item Response Models, Goodness of Fit, Item Parameters, Test Length