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Small N Justifies Rasch Model IRT

Author(s):
Lord, Frederic M.
Publication Year:
1983
Source:
Weiss, David J. (ed.) New Horizons in Testing: Latent Trait Test Theory and Computerized Adaptive Testing. New York: Academic Press, Inc., 1983, p51-61
Document Type:
Chapter
Page Count:
11
Subject/Key Words:
Item Response Theory (IRT), Rasch Model, LOGIST