An Electronic Infrastructure for a Future Generation of Tests

Author(s):

Bennett, Randy Elliot

Publication Year:

2003

Source:

O'Neil, H.F.; Perez, R. (eds.) Technology Applications in Education: A Learning View. Mahwah, NJ: Lawrence Erlbaum Assoicates, 2003, p267-281

Document Type:

Chapter

Page Count:

15

Subject/Key Words:

Graduate Management Admission Test (GMAT), Graduate Record Examinations (GRE), Computer-Based Testing (CBT)