Assessing Fit of Latent Regression Models NAEP
- Author(s):
- Sinharay, Sandip; Guo, Zhumei; von Davier, Matthias; Veldkamp, Bernard
- Publication Year:
- 2010
- Source:
- von Davier, Matthias; Hastedt, Dirk (eds.) IERI Monograph Series: Issues and Methodologies in Large-Scale Assessments: Volume 3. 2010, p35-55
- Document Type:
- Chapter
- Page Count:
- 21
- Subject/Key Words:
- National Assessment of Educational Progress (NAEP), Latent Regression, Model Fit