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Reliability of Multistage Tests Using Item Response Theory MST IRT NAEP

Author(s):
van Rijn, Peter
Publication Year:
2014
Source:
Yan, Duanli; von Davier, Alina A.; Lewis, Charles (eds.) Computerized Multistage Testing: Theory and Applications. Boca Raton: Chapman and Hall/CRC, 2014, p251-263
Document Type:
Chapter
Page Count:
13
Subject/Key Words:
Multistage Testing (MST), Scoring, Validity, Reliability, Item Response Theory (IRT), National Assessment of Educational Progress (NAEP)

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