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Effects of Generation Model on Detecting AI-Generated Essays in a Writing Test
Author(s):
Zu, Jiyun;
Fauss, Michael;
Li, Chen
Publication Year:
2025
Source:
Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con) – Volume 3: Coordinated Session Papers, Pittsburgh, PA, Oct 27-29, 2025, p92-98
Document Type:
Chapter
Page Count:
7
Subject/Key Words:
Artificial Intelligence,
Large Language Models (LLM),
Test Security,
Cheating,
Aberrancy Detection,
Algorithms,
Bias,
Machine Learning,
Natural Language Processing (NLP),
Writing Skills
Read More
https://aclanthology.org/2025.aimecon-sessions.11/