skip to main content skip to footer

Free Response Test Grading Method (Expired)

Author(s):
Kraft, William D.
Patent Issued:
Dec 18, 1990
Patent Number:
4,978,305
Source:
ETS Patent
Document Type:
Patent
Family ID:
23425393
Subject/Key Words:
Patent, Expired Patent, Test Scoring, Free Response Tests, Constructed-Response Scoring, Distributed Scoring, Computer Based Environment

Abstract

A method and system for grading free response tests including the use of highly accurate machine-readable data codes to uniquely associate test-taker, test and reader/grader, and a portable sensing device which stores codes read by the device for subsequent entry into a host computer. The method permits multiple readers/graders to evaluate the same test without one reader/grader influencing another, while reducing paper handling and key entry of data inherent in large volume paper and pencil testing techniques.

Read More