Free Response Test Grading Method (Expired)
- Author(s):
- Kraft, William D.
- Patent Issued:
- Dec 18, 1990
- Patent Number:
- 4,978,305
- Source:
- ETS Patent
- Document Type:
- Patent
- Family ID:
- 23425393
- Subject/Key Words:
- Patent, Expired Patent, Test Scoring, Free Response Tests, Constructed-Response Scoring, Distributed Scoring, Computer Based Environment
Abstract
A method and system for grading free response tests including the use of highly accurate machine-readable data codes to uniquely associate test-taker, test and reader/grader, and a portable sensing device which stores codes read by the device for subsequent entry into a host computer. The method permits multiple readers/graders to evaluate the same test without one reader/grader influencing another, while reducing paper handling and key entry of data inherent in large volume paper and pencil testing techniques.