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Method of Evaluation Fit of Raw Data to Model Data (Expired)

Author(s):
Roussos, Louis Ablen
Patent Issued:
Oct 21, 2008
Patent Number:
7,440,725
Source:
ETS Patent
Document Type:
Patent
Family ID:
38874528
Subject/Key Words:
Patent, Expired Patent, Diagnostic Assessment, Test Takers, Data Analysis, Test Items, Mastery

Abstract

Methods and systems for evaluating the fit of raw data to model data are disclosed. Relationships between an assessment item and a tested attribute, responses from examinees to an assessment item, mastery states for an examinee for a tested attribute, one or more parameters based on expected assessment item performance, estimates for non-tested attributes for each examinee, likelihoods that an examinee that has mastered attributes pertaining to an assessment item will answer the item correctly, likelihoods that an examinee that has not mastered an attribute for an assessment item will answer the item correctly, and/or other variables may be received. For each item and/or for each examinee, a determination of a class for the examinee and/or item may be determined. Statistics may also be generated for each examinee, each item, an examination and/or any other basis.

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