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Method for Estimating Examinee Attribute Parameters in a Cognitive Diagnosis Model

Author(s):
Bolt, Daniel M.; Fu, Jianbin
Patent Issued:
Aug 26, 2008
Patent Number:
7,418,458
Source:
ETS Patent
Document Type:
Patent
Family ID:
35150615
Subject/Key Words:
Patent, Active Patent, Diagnostic Assessment, Test Takers, Ability Estimation, Cognitive Diagnosis, Score Comparison, Item Threshold

Abstract

A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.

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