Method for Estimating Examinee Attribute Parameters in a Cognitive Diagnosis Model
- Author(s):
- Bolt, Daniel M.; Fu, Jianbin
- Patent Issued:
- Aug 26, 2008
- Patent Number:
- 7,418,458
- Source:
- ETS Patent
- Document Type:
- Patent
- Family ID:
- 35150615
- Subject/Key Words:
- Patent, Active Patent, Diagnostic Assessment, Test Takers, Ability Estimation, Cognitive Diagnosis, Score Comparison, Item Threshold
Abstract
A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.