System and Method for Large Scale Survey Analysis
- Author(s):
- Von Davier, Matthias; Xu, Xueli; Yamamoto, Kentaro
- Patent Issued:
- Aug 23, 2011
- Patent Number:
- 8,005,712
- Source:
- ETS Patent
- Document Type:
- Patent
- Family ID:
- 38972459
- Subject/Key Words:
- Patent, Active Patent, Survey Data Analysis, General Diagnostic Model (GDM), Data Sets, Large-Scale Assessment, Population Subgroups
Abstract
Disclosed herein is a method of analyzing large scale survey results comprising obtaining a sparse data set representing a subset of an original data set comprising a plurality of individuals' responses to a plurality of questions, wherein the sparse data set comprises less than ninety percent of the responses in the original data set; analyzing the sparse data set using a general diagnostic model; and obtaining estimated person parameters using the general diagnostic model.