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System and Method for Large Scale Survey Analysis

Von Davier, Matthias; Xu, Xueli; Yamamoto, Kentaro
Patent Issued:
Aug 23, 2011
Patent Number:
ETS Patent
Document Type:
Family ID:
Subject/Key Words:
Patent, Active Patent, Survey Data Analysis, General Diagnostic Model (GDM), Data Sets, Large-Scale Assessment, Population Subgroups


Disclosed herein is a method of analyzing large scale survey results comprising obtaining a sparse data set representing a subset of an original data set comprising a plurality of individuals' responses to a plurality of questions, wherein the sparse data set comprises less than ninety percent of the responses in the original data set; analyzing the sparse data set using a general diagnostic model; and obtaining estimated person parameters using the general diagnostic model.

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