Method for Estimating Examinee Attribute Parameters in Cognitive Diagnosis Models (Expired)
- Author(s):
- Templin, Jonathan
- Patent Issued:
- Oct 08, 2013
- Patent Number:
- 8,550,822
- Source:
- ETS Patent
- Document Type:
- Patent
- Family ID:
- 35910028
- Subject/Key Words:
- Patent, Expired Patent, Examinee Attribute Parameters, Cognitive Diagnosis, Model Estimation, Mastery Assessment, Skills Diagnosis, Markov Chain Monte Carlo (MCMC), Dichotomous Items, Polytomous Items
Abstract
A method of determining a mastery level for an examinee from an assessment is disclosed. The method includes receiving one or more of an overall skill level for an examinee, a weight for the overall skill level, a covariate vector for an examinee, and a weight for the covariate vector. An examinee attribute value is computed using one or more of the received values for each examinee and each attribute. The computation of the examinee attribute values can include estimating the value using a Markov Chain Monte Carlo estimation technique. Examinee mastery levels are then assigned based on each examinee attribute level. Dichotomous or polytomous levels can be assigned based on requirements for the assessment.