Platform For Characterizing Performance On A Scenario-based Assessment To School Differences In Curriculum
- Author(s):
- Deane, Paul; Zhang, Mo; Li, Chen; van Rijn, Peter; Guo, Hongwen; Roth, Amanda; Winchester, Eowyn; Richter, Theresa; Bennett, Randy E.
- Patent Issued:
- Oct 03, 2023
- Patent Number:
- 11,776,415
- Source:
- ETS Patent
- Document Type:
- Patent
- Family ID:
- 1000005002970
- Subject/Key Words:
- Patent, Active Patent, Scenario-Based Assessments, Process Data, Ability Level, Student Progress, Data Analysis
Abstract
A method comprising accessing a first data structure that is associated with a first product prepared by a student and that includes first process data associated with a process performed by the student in generating the first product, analyzing the first data structure to generate a first characterization score based on the first product and the first process data, accessing a second data structure that is associated with a second product prepared by the student and that includes second process data associated with a process performed by the student in generating the second product, analyzing the second data structure to generate a second characterization score based on the second product and the second process data, and calculating a skill level change metric based on the first characterization score and the second characterization score indicating a change in ability level of the student over a course of the scenario-based assessment.