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Understanding Educational Quality: Where Validity Meets Technology

Baker, Eva L.
Publication Year:
William H. Angoff Memorial Lecture Series
Document Type:
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Subject/Key Words:
Accountability Performance Assessment Learning Domains Content Assessment Quality Assurance Standardized Tests Technology Educational Quality National Center for Research on Evaluation, Standards, and Student Testing (CRESST) Angoff Memorial Lecture Series


The fifth annual William H. Angoff Memorial Lecture was presented at Educational Testing Service, Princeton, New Jersey, on November 8, 1998. The fifth annual William H. Angoff Lecture suggests that technology provides a venue and some tools to attack persistent problems in educational assessment, particularly in the K-12 system.

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