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Understanding Educational Quality: Where Validity Meets Technology CRESST

Author(s):
Baker, Eva L.
Publication Year:
2000
Source:
William H. Angoff Memorial Lecture Series, ETS Policy Information Center Report
Document Type:
Publication
Page Count:
28
Subject/Key Words:
Accountability, Performance Assessment, Learning Domains, Content Assessment, Quality Assurance, Standardized Tests, Technology, Educational Quality, National Center for Research on Evaluation, Standards, and Student Testing (CRESST), Angoff Memorial Lecture Series

Abstract

The fifth annual William H. Angoff Lecture suggests that technology provides a venue and some tools to attack persistent problems in educational assessment, particularly in the K-12 system.

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