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The Second Century of Ability Testing: Some Predictions and Speculations

Embretson, Susan
Publication Year:
William H. Angoff Memorial Lecture Series
Document Type:
Page Count:
Subject/Key Words:
Ability Identification Test Development History of Testing Intelligence Testing Stanford-Binet Group Testing Item Response Theory (IRT) Item Types Aptitude Tests Lord, Frederic Mather Computer-Based Testing (CBT) Test Reliability Test Validity Armed Services Vocational Aptitude Battery (ASVAB) Artificial Intelligence Graduate Record Examinations (GRE) Test of English as a Foreign Language (TOEFL) Electronic Essay Rater (E-rater)


The seventh annual William H. Angoff Memorial Lecture was presented at Educational Testing Service, Princeton, New Jersey, on January 11, 2001. The seventh annual William H. Angoff Memorial Lecture predicts that the integration of cognitive theory with advances in psychometrics will bring major, exciting changes in testing during the new century.

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