A Bayesian Random Effects Model for Testlets SAT
- Author(s):
- Bradlow, Eric T.; Wainer, Howard; Wang, Xiaohui
- Publication Year:
- 1998
- Report Number:
- RR-98-03
- Source:
- ETS Research Report
- Document Type:
- Report
- Page Count:
- 31
- Subject/Key Words:
- Bayesian Statistics, Data Augmented Gibbs Sampler, Item Response Models, Models, Testlets, SAT
Abstract
The modified and standard IRT models are both applied to a data set from a disclosed form of the SAT. We also provide simulation results that indicate that the degree of precision bias is a function of the variability of the testlet effects, as well as the testlet design.
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- http://dx.doi.org/10.1002/j.2333-8504.1998.tb01752.x