A Bayesian Random Effects Model for Testlets SAT
- Author(s):
-
Bradlow, Eric T.;
Wainer, Howard;
Wang, Xiaohui
- Publication Year:
- 1998
- Report Number:
-
RR-98-03
- Source:
-
ETS Research Report
- Document Type:
- Report
- Page Count:
- 31
- Subject/Key Words:
-
Bayesian Statistics,
Data Augmented Gibbs Sampler,
Item Response Models,
Models,
Testlets,
SAT
Abstract
The modified and standard IRT models are both applied to a data set from a disclosed form of the SAT. We also provide simulation results that indicate that the degree of precision bias is a function of the variability of the testlet effects, as well as the testlet design.
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