skip to main content skip to footer

Assessing Fit of Latent Regression Models

Sinharay, Sandip; Guo, Zhumei; von Davier, Matthias; Veldkamp, Bernard
Publication Year:
Report Number:
ETS Research Report
Document Type:
Page Count:
Subject/Key Words:
Bootstrap (Statistics), National Assessment of Educational Progress (NAEP), p-value, Latent Regression


The reporting methods used in large-scale educational assessments such as the National Assessment of Educational Progress (NAEP) rely on a latent regression model. There is a lack of research on the assessment of fit of latent regression models. This paper suggests a simulation-based model-fit technique to assess the fit of such models. The technique consists of investigating whether basic statistical summaries are predicted adequately by the latent regression model. Application of the suggested technique to an operational NAEP data set reveals important information regarding the fit of the latent regression model to the data.

Read More