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Alternate Forms Test-Retest Reliability and Test Score Changes for the TOEIC Speaking and Writing Tests

Author(s):
Liao, Chi-Wen; Qu, Yanxuan
Publication Year:
2010
Report Number:
TC-10-10
Source:
TOEIC Compendium
Document Type:
Report
Page Count:
14
Subject/Key Words:
Alternate Forms English as a Foreign Language (EFL) English as a Second Language (ESL) English Language Proficiency English Language Skills Reliability Self-Assessment Speaking Skills Test of English for International Communication (TOEIC) Test-Taker Performance Validity Writing Skills

Abstract

SUMMARY: The reliability or consistency of scores can be examined in a variety of ways, including the degree to which scores for the same test taker are consistent across different test forms (so-called "equivalent forms reliability") and different occasions of testing ("test-retest reliability"). This study examined the consistency of TOEIC Speaking and Writing scores across different test forms at different time intervals (e.g., 1–30 days, 31–60 days) and found that test scores had reasonably high equivalent form test-retest reliability. This indicates that the test takers' scores are consistent across different test forms and/or on different occasions, providing additional evidence of the consistency and reliability of TOEIC test scores. ABSTRACT: The alternate form test-retest reliability coefficients estimated for the TOEIC Speaking and Writing tests from this study are considered reasonably high and acceptable for their intended purposes. Factors such as the reduction of score range and homogeneity of groups, however, should always be considered when trying to interpret and use the data. This paper is part of the Research Foundation for TOEIC: A Compendium of Studies, published by ETS in 2010.

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