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Linking OPIc Levels to TOEIC Speaking Scores TOEIC OPIc

Qu, Yanxuan; Schmidgall, Jonathan; Cid, Jaime; Chan, Eric
Publication Year:
Report Number:
ETS Research Memorandum
Document Type:
Page Count:
Subject/Key Words:
TOEIC Speaking Test, South Korea, Oral Proficiency Interview-Computer (OPIc), Score Mapping, Scale Alignment, Equipercentile Linking, Score Comparison, Test Comparability, Test Score Reliability, English Proficiency, Speaking Proficiency


This study reports a comparison between scores on the Oral Proficiency Interview-Computer (OPIc) test and the TOEIC Speaking test for South Korean test takers. It begins by examining the extent to which the tests (a) measure speaking proficiency in a similar manner, (b) have similar test populations, (c) measure similar ranges of speaking proficiency, and (d) have comparable levels of reliability. Based on the comparability of the tests, several approaches to score mapping were investigated empirically using a sample of South Korean test takers (N = 1,019) who completed both tests within a specified time period. The analysis resulted in a table that can be used to compare scores on the OPIc (as currently used in South Korea) and the TOEIC Speaking test with the understanding that scores on the tests should not be considered interchangeable given important differences regarding aspects of their design and reported range of proficiency.

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